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    3. IEC62368 test probe kit BND-TPK08

      Product Description:BND-TPK08 IEC62368-1:2010 test probe kitstandard:IEC62368-1:20101. Figure V.1 – Jointed test probe for equipment likely to be accessible to children2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children3. Figure V.3 – Blunt probe4. Figure V.4 – Wedge probe
      Description

      Product Description:

      BND-TPK08 IEC62368-1:2010 test probe kit

      standard:IEC62368-1:2010


      1. Figure V.1 – Jointed test probe for equipment likely to be accessible to children

      2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children

      3. Figure V.3 – Blunt probe

      4. Figure V.4 – Wedge probe

      5. Figure V.5 – Terminal probe


      Products drawing and pictures:

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